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XFPA-1.7-640-LN2 detector series

Lowest noise SWIR detector to measure low light

The XFPA-1.7-640-LN2 excels in performance for your R&D spectroscopy or semiconductor failure analysis task. These demanding applications, where very low light levels need to be measured, require image sensors with low dark current, low noise and best responsitivity in the SWIR range. All of these features are now combined in one single device. 

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XFPA-1.7-640-LN2: LN2 cooled high resolution SWIR detector

Key Features

  • 640 x 512 pixels InGaAs detector
  • 20 µm pixel pitch
  • Noise < 20 e-
  • Dark current < 5e-/sec per pixel
  • 0.85 to 1.6 µm (optional 0.4 to 1.6µm)             sensitivity
  • Frame rate 2.5 Hz (4 output mode)
  • LN2 cooled

XFPA-1.7-640-LN2 detectors: LN2 cooled high resolution SWIR detector

The XFPA-1.7-640-LN2 SWIR detector is designed to have the lowest noise and highest sensitivity for low-light-level measurements.

The XFPA-1.7-640-LN2 excels in performance for any R&D spectroscopy or semiconductor failure analysis task. These demanding applications, where very low light levels need to be measured, require image sensors with low dark current, low noise and best responsitivity in the SWIR range. All of these features are now combined in one single device.

The in-house developed InGaAs detector XFPA-1.7-640-LN2 is optimized for 77K operation, using Liquid Nitrogen (LN2) cooling and is based on a SFD (Source Follower per Detector) read-out topology for ultra-low noise levels ever seen (<20 e-). Additionally, a very low dark current of less than 5e-/pixel allows for integration times of several hours.

The high resolution 640 x 512 InGaAs detector with 20 µm pixel pitch features a maximum full frame rate of 2.5 Hz. The frame rate can be increased when a smaller region-of-interest is selected. A non-destructive read-out mode simplifies operation when long integration times are used.

Key Benefits

 - Lowest noise

 - High sensitivity

 - Low dark current

 - Extreme long integration time

 - Measuring extreme low light signals

 - Extending SWIR imaging to the visible

 

 

XFPA-1.7-640-LN2 detectors: Detailed specifications

Array Specifications

XFPA-1.7-640-LN2
Array characteristics @ 77K
Array type InGaAs
Spectral band

Standard 0.85 to 1.6 µm;

Optional 0.4µm to 1.6 µm
# pixels 640 x 512
Pixel pitch 20 µm x 20 µm
FPA cooling LN2
Full frame rate 2.5 Hz (4 output mode)
# outputs 1 or 4 selectable
Integration time up to 24 hours
Pixel operability > 98%
Detector characteristics @ 77K
Peak sensitivity wavelength 1.5 µm
Peak Quantum Efficiency > 80%
Windowing Yes
ITR and IWR Yes
Operating temperature range 77 - 300 K
Pixel clock frequency 20 KHz or 250 KHz
Power consumption 2 Watt
Supply Voltage 3.3 V
Gain (e-/ADU count) 2.2 µV/e-
Pixel Well Depth 400 000 e-
Noise <20 e-
Dark current <5 e-/sec per pixel
Dynamic range 100 dB

XFPA-1.7-640-LN2 Detectors: Applications

The XFPA-1.7-640-LN2 detectors are lowest noise and highest sensitivty high resolution SWIR detectors. They excel in applications where very low light levels need to be measured:

 

Media Library

Application Examples

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Astronomy

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Lab spectroscopy

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Photon emission

 

XFPA-1.7-640-LN2 detectors: Documentation

All additional information about our XFPA-1.7-640-LN2 cooled high resolution SWIR detectors can be found within the following documentation:

Brochures

Brochure on request

Press release

Lowest noise SWIR detector XFPA-1.7-640-LN2

 

Feel free to contact us for more information.

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